Emerging Nanotechnologies (Springer, 2008).pdf

(9025 KB) Pobierz
308679586 UNPDF
308679586.001.png
Emerging Nanotechnologies
Frontiers in Electronic Testing
Series Editor: Vishwani Agrawal
Auburn University
Auburn, Alabama
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
Mohammad Tehranipoor (Ed.)
Volume 37, ISBN 978-0-387-74746-0, 2008
Oscillation-Based Test in Mixed-Signal Circuits
G. Huertas Sánchez, D. Vázquez Garcia de la Vega, A. Rueda Rueda, and J.L. Huertas Díaz
Volume 36, ISBN 978-1-4020-5314-6, 2006
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500 TM
Francisco da Silva, Teresa McLaurin, and Tom Waayers
Volume 35, ISBN 978-0-387-30751-0, 2006
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, Second Edition
Manoj Sachdev and José Pineda de Gyvez
Volume 34, ISBN 978-0-387-46546-3, 2007
Digital Timing Measurements: From Scopes and Probes to Timing and Jitter
Wolfgang Maichen
Volume 33, ISBN 978-0-387-31418-1, 2006
Fault-Tolerance Techniques for SRAM-Based FPGAs
Fernanda Lima Kastensmidt, Luigi Carro, and Ricardo Reis
Volume 32, ISBN 978-0-387-31068-8, 2006
Data Mining and Diagnosing IC Fails
Leendert M. Huisman
Volume 31, ISBN 978-0-387-24993-3, 2005
Fault Diagnosis of Analog Integrated Circuits
Prithviraj Kabisatpathy, Alok Barua, and Satyabroto Sinha
Volume 30, ISBN 978-0-387-25742-6, 2005
Introduction to Advanced System-on-Chip Test Design and Optimization
Erik Larsson
Volume 29, ISBN 978-1-4020-3207-3, 2005
Embedded Processor-Based Self-Test
Dimitris Gizopoulos, A. Paschalis, and Yervant Zorian
Volume 28, ISBN 978-1-4020-2785-7, 2004
Advances in Electronic Testing: Challenges and Methodologies
Dimitris Gizopoulos (Ed.)
Volume 27, ISBN 978-0-387-29408-7, 2006
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
Said Hamdioui
Volume 26, ISBN 978-1-4020-7752-4, 2004
Verification by Error Modeling: Using Testing Techniques in Hardware Verification
Katarzyna Radecka and Zeljko Zilic
Volume 25, ISBN 978-1-4020-7652-7, 2004
Elements of STIL: Principles and Applications of IEEE Std. 1450
Gregory A. Maston, Tony R. Taylor, and Julie N. Villar
Volume 24, ISBN 978-1-4020-7637-4, 2003
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
Alfredo Benso and P. Prinetto (Eds.)
Volume 23, ISBN 978-1-4020-7589-6, 2003
(Continued after index)
Mohammad Tehranipoor
Editor
Emerging Nanotechnologies
Test, Defect Tolerance, and Reliability
ABC
Editor
Mohammad Tehranipoor
Department of Electrical and Computer
Engineering
University of Connecticut
Storrs, CT 06269
USA
Series Editor
Vishwani Agrawal
Department of Electrical and Computer
Engineering
Auburn University
Auburn, AL 36849
USA
ISBN 978-0-387-74746-0
e-ISBN 978-0-387-74747-7
Library of Congress Control Number: 2007933699
c
2008 Springer Science+Business Media, LLC
All rights reserved. This work may not be translated or copied in whole or in part without the written
permission of the publisher (Springer Science+Business Media, LLC, 233 Spring Street, New York, NY
10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection
with any form of information storage and retrieval, electronic adaptation, computer software, or by similar
or dissimilar methodology now known or hereafter developed is forbidden.
The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are
not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject
to proprietary rights.
Printed on acid-free paper.
987654321
springer.com

Plik z chomika:

Inne pliki z tego folderu:

Inne foldery tego chomika:

Zgłoś jeśli naruszono regulamin