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High-speed double diode
DISCRETE SEMICONDUCTORS
DATA SHEET
book, halfpage
M3D088
BAW56
High-speed double diode
Product specification
Supersedes data of 1996 Sep 17
1999 May 11
Philips Semiconductors
Product specification
High-speed double diode
BAW56
FEATURES
DESCRIPTION
PINNING
·
Small plastic SMD package
The BAW56 consists of two
high-speed switching diodes with
common anodes, fabricated in planar
technology, and encapsulated in the
small SOT23 plastic SMD package.
PIN
DESCRIPTION
·
High switching speed: max. 4 ns
1
cathode (k1)
·
Continuous reverse voltage:
max. 75 V
2
cathode (k2)
3
common anode
·
Repetitive peak reverse voltage:
max. 85 V
·
Repetitive peak forward current:
max. 450 mA.
handbook, 4 columns
2
1
APPLICATIONS
·
2
1
High-speed switching in thick and
thin-film circuits.
3
3
Top view
MAM206
Marking code:
A1p = made in Hong Kong; A1t = made in Malaysia.
Fig.1 Simplified outline (SOT23) and symbol.
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
Per diode
V
RRM
repetitive peak reverse voltage
-
85
V
V
R
continuous reverse voltage
-
75
V
I
F
continuous forward current
single diode loaded; note 1;
see Fig.2
-
215
mA
double diode loaded; note 1;
see Fig.2
-
125
mA
I
FRM
repetitive peak forward current
-
450
mA
I
FSM
non-repetitive peak forward
current
square wave; T
j
=25
°
C prior to
surge; see Fig.4
t=1
m
s
-
4
A
t=1ms
-
1
A
t=1s
-
0.5
A
P
tot
total power dissipation
T
amb
=25
°
C; note 1
-
250
mW
T
stg
storage temperature
-
65
+150
°
C
T
j
junction temperature
-
150
C
Note
1. Device mounted on an FR4 printed-circuit board.
1999 May 11
2
°
Philips Semiconductors
Product specification
High-speed double diode
BAW56
ELECTRICAL CHARACTERISTICS
T
j
=25
°
C unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MAX.
UNIT
Per diode
V
F
forward voltage
see Fig.3
I
F
= 1 mA
715
mV
I
F
= 10 mA
855
mV
I
F
=50mA
1
V
I
F
= 150 mA
1.25
V
I
R
reverse current
see Fig.5
V
R
=25V
30
nA
V
R
=75V
1
m
A
V
R
=25V; T
j
= 150
°
C
30
m
A
V
R
=75V; T
j
= 150
°
C
50
m
A
C
d
diode capacitance
f = 1 MHz; V
R
= 0; see Fig.6
2
pF
t
rr
reverse recovery time
when switched from I
F
= 10 mA to
I
R
= 10 mA; R
L
= 100
W
;
measured at I
R
= 1 mA; see Fig.7
4
ns
V
fr
forward recovery voltage
when switched from I
F
= 10 mA;
t
r
= 20 ns; see Fig.8
1.75
V
THERMAL CHARACTERISTICS
SYMBOL
PARAMETER
CONDITIONS
VALUE
UNIT
R
th j-tp
thermal resistance from junction to tie-point
360
K/W
R
th j-a
thermal resistance from junction to ambient
note 1
500
K/W
Note
1. Device mounted on an FR4 printed-circuit board.
1999 May 11
3
Philips Semiconductors
Product specification
High-speed double diode
BAW56
GRAPHICAL DATA
MBD033
MBG382
300
300
handbook, halfpage
I
F
(mA)
I
F
(mA)
(1)
(2)
(3)
200
200
single diode loaded
double diode loaded
100
100
0
0
0
1
2
0
100
T ( C)
o
200
V
F
(V)
amb
Device mounted on an FR4 printed-circuit board.
(1) T
j
= 150
°
C; typical values.
(2) T
j
=25
°
C; typical values.
(3) T
j
=25
°
C; maximum values.
Fig.2 Maximum permissible continuous forward
current as a function of ambient
temperature.
Fig.3 Forward current as a function of forward
voltage.
10
2
MBG704
handbook, full pagewidth
I
FSM
(A)
10
1
10
-
1
1
10
10
2
10
3
t
p
(
m
s)
10
4
Based on square wave currents.
T
j
=25
°
C prior to surge.
Fig.4 Maximum permissible non-repetitive peak forward current as a function of pulse duration.
1999 May 11
4
Philips Semiconductors
Product specification
High-speed double diode
BAW56
MGA884
MBH191
10
5
2.5
handbook, halfpage
C
d
(pF)
I
R
(nA)
10
4
V = 75 V
R
2.0
1.5
10
3
max
75 V
1.0
10
2
25 V
0.5
typ
typ
10
0
0
5
10
15
20
25
0
100
o
200
T ( C)
j
V
R
(V)
f = 1 MHz; T
j
=25
°
C.
Fig.5 Reverse current as a function of junction
temperature.
Fig.6 Diode capacitance as a function of reverse
voltage; typical values.
1999 May 11
5
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