Fundamentals of Semiconductor Manufacturing and Process Control - G. May, C. Spanos (Wiley, 2006) WW.pdf

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FUNDAMENTALS OF
SEMICONDUCTOR
MANUFACTURING AND
PROCESS CONTROL
FUNDAMENTALS OF
SEMICONDUCTOR
MANUFACTURING AND
PROCESS CONTROL
Gary S. May, Ph.D.
Georgia Institute of Technology
Atlanta, Georgia
Costas J. Spanos, Ph.D.
University of California at Berkeley
Berkeley, California
A JOHN WILEY & SONS, INC., PUBLICATION
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Copyright
2006 by John Wiley & Sons, Inc. All rights reserved
Published by John Wiley & Sons, Inc., Hoboken, New Jersey
Published simultaneously in Canada.
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Library of Congress Cataloging-in-Publication Data:
May, Gary S.
Fundamentals of semiconductor manufacturing and process control / Gary S.
May, Costas J. Spanos.
p. cm.
“Wiley-Interscience.”
Includes bibliographical references and index.
ISBN-13: 978-0-471-78406-7 (cloth : alk. paper)
ISBN-10: 0-471-78406-0 (cloth : alk. paper)
1. Semiconductors — Design and construction. 2. Integrated circuits — Design
and construction. 3. Process control — Statistical methods. I. Spanos, Costas
J. II. Title.
TK7871.85.M379 2006
621.3815 2 — dc22
2005028448
Printed in the United States of America
10987654321
To my children,
Simone and Jordan,
who inspire me.
— Gary S. May
To my family,
for their love and understanding.
— Costas J. Spanos
CONTENTS
Preface
xvii
Acknowledgments
xix
1 Introduction to Semiconductor Manufacturing
1
Objectives / 1
Introduction / 1
1.1. Historical Evolution / 2
1.1.1. Manufacturing and Quality Control / 3
1.1.2. Semiconductor Processes / 5
1.1.3. Integrated Circuit Manufacturing / 7
1.2. Modern Semiconductor Manufacturing / 8
1.2.1. Unit Processes / 9
1.2.2. Process Sequences / 11
1.2.3. Information Flow / 12
1.2.4. Process Organization / 14
1.3. Goals of Manufacturing / 15
1.3.1. Cost / 15
1.3.2. Quality / 17
1.3.3. Variability / 17
1.3.4. Yield / 17
1.3.5. Reliability / 18
1.4. Manufacturing Systems / 18
1.4.1. Continuous Flow / 19
1.4.1.1. Batch Processes / 20
1.4.1.2. Single Workpiece / 20
1.4.2. Discrete Parts / 21
1.5. Outline for Remainder of the Book / 21
Summary / 22
Problems / 22
References / 23
vii
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